Background
Objective
Study Design
Results
Conclusion
Key words
- copper intrauterine device
- intrauterine device
- intrauterine device complication
- intrauterine device expulsion
- intrauterine device retention
- long-acting reversible contraception
- postpartum contraception
- postpartum intrauterine device
- postplacental intrauterine device
- TCu380A intrauterine device
- vaginal delivery
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Article Info
Publication History
Footnotes
This research was sponsored by a grant from the Society of Family Planning Research Fund (SFPRF15-15). This study was funded in part by Women’s Reproductive Health Research award (Dr Sonalkar): K12-HD001265-18, and a Society of Family Planning Research Fund Midcareer Mentor Award (Dr Schreiber). Intrauterine devices were donated, in part, by Teva Pharmaceuticals, the Ryan LARC Grant, and the philanthropic efforts of Dr Ann Steiner’s LARC Project. The funding sources had no role in study design; data collection, analysis, or interpretation; manuscript writing, or the decision to submit for publication.
Disclosure: Dr Gurney is a Nexplanon trainer for Merck. Dr Schreiber is a consultant for Bayer Pharmaceuticals and receives research funding from Bayer Pharmaceuticals, ContraMed, Medicines360, and the Eunice Kennedy Shriver National Institute of Child Health and Human Development. Drs Sonalkar and Sammel, and Ms McAllister report no conflict of interest.
Cite this article as: Gurney EP, Sonalkar S, McAllister A, et al. Six-month expulsion of postplacental copper intrauterine devices placed after vaginal delivery. Am J Obstet Gynecol 2018;219:183.e1-9.